SF-C1500

Semiauto probe station for high accuracy measurements of low signals on the wafer up to 6-inch diameter with inker.

Main Features:

• Joystick chuck movement control
• Inker unit for fault crystals
• Contact sensor to check needle contact with the DUT
• 3 microscope images at various magnifications ensure an optimum image of the DUT and the area around it
• Pieces of a wafer can be processed
• Сhamber provides electromagnetic shielding for high-accuracy measurements