當前全球車用功率半導體認證AQG-324是一項重要的測試標準，主要用於驗證汽車行業的功率模塊的特性和壽命。這項標準由歐洲電力電子中心（European Center for Power Electronics, ECPE）主導制定，被廣泛認爲是汽車功率模塊的基本要求之一，許多汽車製造商將其作爲評估和選擇功率模塊的重要依據。

禧恩科技工程團隊秉持著持續不斷求新求變之精神，開發新產品以滿足不同客戶之需求，除了可提供功率模組的動態和靜態全部測試服務以外，今年度結合日商半導體元件熱特性(thermal characterization)量測儀器設備供應商技術合作，提供功率模組熱特性和功率循環測試服務，目前實績包括：協助台灣頂尖國立大學建立AQG-324全套驗證實驗室、以及提供第三方認證單位相關AQG-324電性測試驅動控制板和轉接版。

二、禧恩科技依據AQG-324的測試標準，提供測試項目如下：

如想了解更多執行細節和測試需求，歡迎來電共同討論！
客服專線: +886 3 5506360 銷售部 分機215、分機213

Keysight全系列功率半導體解決方案，禧恩可以滿足您從實驗室研發階段到生產線量測之需求。

Keysight PD1500A、PD1550A產品介紹：

Keysight PD1500A 動態功率元件分析儀/雙脈衝測試儀
PD1500A Dynamic Power Device Analyzer/Double Pulse Tester

PD1500A 是現成可用的量測解決方案，讓您能輕鬆進行可靠、可重複的寬能隙半導體量測。 此平台可確保使用者安全，並可保護系統的量測硬體。
As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.

Product Features
Highlights

• Reliable, repeatable measurement of wide-bandgap (SiC, GaN) power semiconductor dynamic characteristics.
• Characteristics measured include, turn-on, turn-off, switching, reverse recovery, gate charge, and many others.
• Sate test environment for both the DUT and the user.
• Expandable, upgradeable, modular platform enables testing of all power devices.

Keysight PD1550A 先進動態功率元件分析儀/雙脈衝測試儀
PD1550A Advanced Dynamic Power Device Analyzer / Double-Pulse Tester

PD1550A 雙脈衝測試儀可對寬帶隙功率模組進行可靠的測量。
PD1550A Double Pulse Tester delivers reliable measurement of wide band gap power modules..

Product Features
Highlights

• Reliable, repeatable measurement of wide-bandgap (SiC, GaN) power semiconductor dynamic characteristics for discreet devices and power modules.
• Characteristics measured include turn-on, turn-off, switching, reverse recovery, gate charge, and many others.
• True Pulse isolate probe for measuring a power module’s high-side device.
• Solderless contact technology for repeatable, reliable results without soldering.
• Safe test environment for both the DUT and the user.
• Customizable, expandable, upgradeable, modular platform enables testing of all power devices.

歡迎來電諮詢，共同討論您的測試需求
客服專線: 03-5506360 銷售部 分機215、分機213

為滿足客戶不同之需求，禧恩科技即將在2024年推出新產品，將以更精進的技術服務，協助您從規劃產品、研發、到生產製造，完整之第三代半導體測試線和解決方案，主要新產品：

‧SiC/GaN CP測試
‧WLBI（wafer level burn in）測試系統
‧KGD測試方案

歡迎來電諮詢，共同討論您的測試需求！
客服專線: 03-5506360 銷售部 分機215、分機218

Test SiC and GaN semiconductors at high switching speeds for optimal results

 

April 21st, Guildford, UK: ipTEST has been honoured with the prestigious King’s Award for Enterprise in recognition of advancing the test capabilities available for high power SiC and GaN semiconductors.

Wide bandgap SiC and GaN semiconductors have opened up new possibilities for power device performance. The benefits are widespread, from allowing electric vehicles to travel further on the same battery, to enabling more efficient, lower cost electricity conversion in power-hungry data centres.

Testing power devices before they reach the customer is crucially important to ensure they perform reliably throughout their lifetime. For the most accurate results, devices should be tested as close to their operating speed as possible. However, this is a challenge for SiC and GaN which are usually switched at much higher speeds than conventional silicon. A silicon tester just cannot keep up.

To solve this problem, ipTEST developed the DS5 test generator. The whole layout of DS5 was designed from the ground up to operate at the highest speeds and perform the fastest dynamic tests. The result is that DS5 gives the clearest picture of SiC and GaN device performance at speed, allowing manufacturers to maximize the quality of their products. This is particularly important for electric vehicle applications where power devices are at the heart of the drivetrain – nobody wants their electric car to fail on the freeway.

“DS5 has been tremendously well received by our customers and I’m so proud it’s been recognised in the Innovation category of the King’s Award.” says Dr Conor McCarthy, Managing Director at ipTEST. “This has been a true team effort by everyone within our company.”

Of course, this is not the end of the story as SiC and GaN semiconductors will continue to evolve and have much more performance to offer. As Demos Malaos, Technical Director at ipTEST says, “DS5 is the first step of the journey. We’ll continue to innovate to offer the highest performance testing capabilities for power devices.”

About the King’s Award
The King’s Awards for Enterprise was previously known as The Queen’s Awards for Enterprise, and the new name reflects His Majesty The King’s desire to continue the legacy of HM Queen Elizabeth II, by recognising outstanding UK businesses. The Award programme, now in its 57th year, is the most prestigious business award in the country, with successful businesses able to use the esteemed King’s Awards Emblem for the next five years.

About ipTEST
ipTEST helps semiconductor manufacturers test their most cutting-edge power devices to achieve optimal performance. Headquartered in Guildford, UK, ipTEST believes that doing the right thing, solving problems together and learning while we grow are key to delivering effective products.

For more information:

Nick Dajda, Sales and Marketing Director

+44 (0)7939 621015

nick.dajda@iptest.com

For more information on Product:

iptest.com/ds5

King’s award for innovation logo:

ipTEST DS5 Test Generator and Applications Adapter:

中山大學張鼎張教授(TSMC/UMC/AUO/Innolux等大廠客座講師, 照片中右三)與禧恩科技，雙方已經談定在GaN/SiC上的測試設備開發合作，張教授後續會安排親自到禧恩科技進行傳授教學，與客戶共同研討。