SF-P2000WCS

POMME semiauto probe station SF-P2000WCS

Product Features

The equipment can be widely used in the manufacturing and research fields of integrated circuits, LED, LCD, solar cells, etc.

  • Support Sic/Gan wafer testing, high power wafer testing;
  • Support various Chuck designs for different wafer testing;
  • Easy Integrated with instrument system;
  • Can upgrade high and low temperature testing environment;
  • Can upgrade to full-automatic test.

X semi-automatic probe station is competent in:

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