SF-C1500
Product Features
Semiauto probe station for high accuracy measurements of low signals on the wafer up to 6-inch diameter with inker.
Main Features:
- Joystick chuck movement control
- Inker unit for fault crystals
- Contact sensor to check needle contact with the DUT
- 3 microscope images at various magnifications ensure an optimum image of the DUT and the area around it
- Pieces of a wafer can be processed
- Сhamber provides electromagnetic shielding for high-accuracy measurements
Data Sheet
| Weight: | 400KG |
| Dimensions (WxDxH): | L950 x W1600 H2010 mm |
| Power Consumption: | AC220V Single phase |
| XY travel range: | X 300mm x Y 500mm |
