Working with our experienced team, you’ll get a comprehensive parametric testing system and software solution to run your testing jobs quickly and efficiently. With our proven testing process for more than 300 customers, we have the right test instrument for your individual needs every time.
PXI-Based instrumentation is that are
The IFSM 3000A Diode Surge Current Tester provides a test for diode surge current, up to 3000A surge current under 10μs pulse width, and another 100μs and 1ms pulse width, a total of three modes can be selected.
Inline Automatic Testing Program
• For inline automatic process TEG testing run
• Inline automatic measurement process recipe setup
• Testing item : FPD TFT IV (IdVg/IdVd), CV, Kelvin testing (R4T)…etc.
• Measurement report save as .csv file
• Prober communication
Instrument Controllable
• Keithley 6430, 2400, 2450…etc
• Keysight B1500A, E5270B, E4980A…etc
FlexTM version 1.6 is the latest measurement software of Pomme
Its functions cover measurement requirements such as FPD, RDL & 4PP
With fast parameter setting and easy use
Can effectively shorten the total time required for measurement.
Flex-T&M Auto Mode for RDL Testing
• For inline automatic process RDL testing run
• Testing item include : Wafer Bumping Leakage & Res
• Measurement report save as .csv file
• Prober communication
Flex-T&M Manual Mode
• For device characteristic quick check
• Inline automatic measurement process recipe setup (Option)
• Measurement report save as .csv file
• Testing item include:
• Wafer Bumping Leakage & Res,
• FPD TFT IV (IdVg/IdVd),
• CV,
• Kelvin testing(R4T)…etc.
Flex-T&M for 4PP SemiAuto Testing
• For Semi-Auto prober 4 point probe (4PP) sheet resistivity testing
• Wafer map quick create
• TCR measurement
• 2D/3D map shows for full wafer testing results
• Measurement report save as .csv file
• Prober communication
Instrument Controllable
• Keithley 6430, 2400, 2600, 2182…etc
• Keysight B1500A, E5270B, 3458A, E4980A…etc
