生成式AI、高效能運算與資料中心建設快速成長，帶動高速光互連及高效率電力轉換需求。

禧恩科技以SiPh矽光子與WBG功率半導體測試為雙核心，整合量測儀器、探針台、測試軟體、Probe Card與Fixture，提供從晶圓、晶粒、元件到模組的一站式測試解決方案。

禧恩科技雙引擎亮相搶攻AI基建商機

資料來源：工商時報
文／呂承庭

生成式AI與高效能運算快速發展，帶動高速光互連與電力轉換升級。專注高階半導體測試方案的禧恩科技（展位：P5800）於SEMICON Taiwan亮相，以SiPh矽光子與WBG化合物半導體雙引擎為核心，展示從晶圓、晶粒、元件到模組的一站式測試能力。

AI運算規模擴大，資料中心對高速、低功耗光互連及高效供電需求俱增。禧恩科技總經理蕭東琦表示，SiPh著重解決高速資料傳輸問題，WBG支援AI伺服器及資料中心高功率電力系統，兩者皆為AI基礎建設不可或缺的測試環節。

SiPh是禧恩布局AI高速傳輸測試的重要引擎。面對800G、1.6T及CPO共封裝光學發展，矽光子測試須整合光學、電性、高頻與精密定位。禧恩結合奈米級自動對光、姿態補償、多通道光功率、波長及PAM4訊號量測，並以軟體串聯探針台、雷射源與電學儀器，因應光電元件及CPO模組驗證需求。

WBG則是AI電力測試的另一引擎。隨AI伺服器及資料中心用電攀升，SiC、GaN功率半導體測試需求同步增加。禧恩設有完整的「WBG實驗室，可支援10 kV、500 A至1,500 A、Double Pulse、UIS、Qg等測試」，並搭配攝氏零下55度至200度以上的溫控探針台與低電感治具，滿足高壓、大電流及極端溫度下的驗證需求。此外，禧恩具備WBG及WAT委測能力，整體測試範圍涵蓋晶圓至模組。

支撐雙引擎發展的核心基礎，來自禧恩長期深耕的WAT／TEG／RDL與RF量測。WAT／TEG具備1 fA（飛安培）級微電流量測能力，可用於晶圓允收測試與製程監控；RDL鎖定2.5D／3D IC及Chiplet先進封裝，執行導通、絕緣及漏電檢測；RF則提供高頻量測及微弱訊號捕捉。這些經驗使禧恩得以整合SiPh的光、電與高頻量測，並支援WBG高壓測試。

蕭東琦指出，禧恩不僅提供單一品牌或儀器，更結合國際設備資源、自有探針台、關鍵治具、機構設計與控制軟體，依據研發及量產需求建構一站式Turnkey方案。藉由此次半導體展，禧恩將呈現SiPh與WBG雙引擎布局，未來將持續擴充相關資源，投入高階探針卡與關鍵治具自主開發，朝AI基礎建設測試方案提供者邁進。

禧恩科技總經理蕭東琦（左三）率領團隊，積極布局AI基礎建設測試。圖／呂承庭攝

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跨足 CPO 與矽光子檢測領域

因應 AI、高效能運算（HPC）及資料中心高速傳輸需求快速成長，禧恩科技同步推出CPO（Co-Packaged Optics）及矽光子檢測解決方案。
透過電性與光學量測技術整合，提供：

• 電光整合測試（E/O、O/E）
• 高速互連驗證
• 矽光子元件特性分析
• 光電模組與先進封裝測試

協助客戶加速新世代高速、低功耗互連技術之開發與導入。

強化客戶價值

透過本次策略合作與技術拓展，禧恩科技將：

• 提供 Keysight Technologies 原廠先進量測技術
• 整合量測設備、探針台與自動化系統
• 支援晶圓、先進封裝、SiC / GaN 與矽光子應用
• 提升研發效率與量產良率
• 加速產品上市時程

禧恩科技總經理 Taylor Hsiao 表示：

「取得是德科技 Strategic Partner 資格，代表禧恩科技邁入全球發展新階段。同時，我們積極布局CPO與矽光子測試領域，協助客戶掌握AI時代的關鍵技術。」未來，禧恩科技將持續投入：

• 高頻高速量測
• SiC / GaN 功率元件測試
• 先進封裝與異質整合
• 矽光子與光電整合測試
• AI 與高效能運算應用

透過與 Keysight Technologies 的緊密合作，持續提供創新且具競爭力的解決方案。

關於禧恩科技

禧恩科技為半導體測試與量測整合解決方案供應商，提供量測設備、探針系統、自動化整合及工程服務，服務全球半導體產業鏈客戶。

聯絡資訊

禧恩科技股份有限公司
新竹縣竹北市興隆路二段341號17樓
Tel: +886-3-5506360 分機216
Email: sales@pommefr.com

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禧恩科技工程團隊秉持著持續不斷求新求變之精神，開發新產品以滿足不同客戶之需求，除了可提供功率模組的動態和靜態全部測試服務以外，今年度結合日商半導體元件熱特性(thermal characterization)量測儀器設備供應商技術合作，提供功率模組熱特性和功率循環測試服務，目前實績包括：協助台灣頂尖國立大學建立AQG-324全套驗證實驗室、以及提供第三方認證單位相關AQG-324電性測試驅動控制板和轉接版。

二、禧恩科技依據AQG-324的測試標準，提供測試項目如下：

如想了解更多執行細節和測試需求，歡迎來電共同討論！
客服專線: +886 3 5506360 銷售部 分機215、分機213

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Keysight PD1500A、PD1550A產品介紹：

Keysight PD1500A 動態功率元件分析儀/雙脈衝測試儀
PD1500A Dynamic Power Device Analyzer/Double Pulse Tester

PD1500A 是現成可用的量測解決方案，讓您能輕鬆進行可靠、可重複的寬能隙半導體量測。 此平台可確保使用者安全，並可保護系統的量測硬體。
As an off-the-shelf measurement solution, the PD1500A delivers reliable, repeatable measurements of wide-bandgap semiconductors. The platform ensures user safety and protection of the system’s measurement hardware.

Product Features
Highlights

• Reliable, repeatable measurement of wide-bandgap (SiC, GaN) power semiconductor dynamic characteristics.
• Characteristics measured include, turn-on, turn-off, switching, reverse recovery, gate charge, and many others.
• Sate test environment for both the DUT and the user.
• Expandable, upgradeable, modular platform enables testing of all power devices.

Keysight PD1550A 先進動態功率元件分析儀/雙脈衝測試儀
PD1550A Advanced Dynamic Power Device Analyzer / Double-Pulse Tester

PD1550A 雙脈衝測試儀可對寬帶隙功率模組進行可靠的測量。
PD1550A Double Pulse Tester delivers reliable measurement of wide band gap power modules..

Product Features
Highlights

• Reliable, repeatable measurement of wide-bandgap (SiC, GaN) power semiconductor dynamic characteristics for discreet devices and power modules.
• Characteristics measured include turn-on, turn-off, switching, reverse recovery, gate charge, and many others.
• True Pulse isolate probe for measuring a power module’s high-side device.
• Solderless contact technology for repeatable, reliable results without soldering.
• Safe test environment for both the DUT and the user.
• Customizable, expandable, upgradeable, modular platform enables testing of all power devices.

歡迎來電諮詢，共同討論您的測試需求
客服專線: 03-5506360 銷售部 分機215、分機213

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禧恩科技提供功率半導體整合方案，也可依您不同的需求客製產品，今年將推出高功率模組產線封測解決方案，歡迎您的參訪與交流!

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“功率半導體測試解決方案”
WBG Total Solution Provider
歡迎您的蒞臨！ first appeared on 禧恩科技 POMME TECHNOLOGIES.

‧SiC/GaN CP測試
‧WLBI（wafer level burn in）測試系統
‧KGD測試方案

歡迎來電諮詢，共同討論您的測試需求！
客服專線: 03-5506360 銷售部 分機215、分機218

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April 21st, Guildford, UK: ipTEST has been honoured with the prestigious King’s Award for Enterprise in recognition of advancing the test capabilities available for high power SiC and GaN semiconductors.

Wide bandgap SiC and GaN semiconductors have opened up new possibilities for power device performance. The benefits are widespread, from allowing electric vehicles to travel further on the same battery, to enabling more efficient, lower cost electricity conversion in power-hungry data centres.

Testing power devices before they reach the customer is crucially important to ensure they perform reliably throughout their lifetime. For the most accurate results, devices should be tested as close to their operating speed as possible. However, this is a challenge for SiC and GaN which are usually switched at much higher speeds than conventional silicon. A silicon tester just cannot keep up.

To solve this problem, ipTEST developed the DS5 test generator. The whole layout of DS5 was designed from the ground up to operate at the highest speeds and perform the fastest dynamic tests. The result is that DS5 gives the clearest picture of SiC and GaN device performance at speed, allowing manufacturers to maximize the quality of their products. This is particularly important for electric vehicle applications where power devices are at the heart of the drivetrain – nobody wants their electric car to fail on the freeway.

“DS5 has been tremendously well received by our customers and I’m so proud it’s been recognised in the Innovation category of the King’s Award.” says Dr Conor McCarthy, Managing Director at ipTEST. “This has been a true team effort by everyone within our company.”

Of course, this is not the end of the story as SiC and GaN semiconductors will continue to evolve and have much more performance to offer. As Demos Malaos, Technical Director at ipTEST says, “DS5 is the first step of the journey. We’ll continue to innovate to offer the highest performance testing capabilities for power devices.”

About the King’s Award
The King’s Awards for Enterprise was previously known as The Queen’s Awards for Enterprise, and the new name reflects His Majesty The King’s desire to continue the legacy of HM Queen Elizabeth II, by recognising outstanding UK businesses. The Award programme, now in its 57th year, is the most prestigious business award in the country, with successful businesses able to use the esteemed King’s Awards Emblem for the next five years.

About ipTEST
ipTEST helps semiconductor manufacturers test their most cutting-edge power devices to achieve optimal performance. Headquartered in Guildford, UK, ipTEST believes that doing the right thing, solving problems together and learning while we grow are key to delivering effective products.

For more information:

Nick Dajda, Sales and Marketing Director

+44 (0)7939 621015

nick.dajda@iptest.com

For more information on Product:

iptest.com/ds5

King’s award for innovation logo:

ipTEST DS5 Test Generator and Applications Adapter:

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2022 Top Electronics Seminar 研討會將探討：電子產業與汽車產業如何透過電動車的設計、技術路線與創新應用，加速落實「2050淨零排放」目標？如何透過「人-車-路-雲」協同的關鍵技術與基礎設施促進電動車實現電動化、智慧化與連網化？如何透過建構汽車產業新生態與新能源基礎設施、加速科技創新以因應挑戰？

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