E5250A Low-leakage Switch Mainframe

General features

• Two matrix card types supported: E5252A matrix cards and E5255A multiplexer cards
• E5252A matrix cards support Kelvin or cost-effective non-Kelvin switching matrix functionality
• E5255A multiplexer cards support long-term multisite reliability testing
• Keysight EasyEXPERT software can control and automate switch settings using application tests

Measurement capabilities

• 20 femtoamp measurement resolution through the switch using 4156C, B1500A, or E5270B HRSMU
• Transient current settling time (to < 450 fA) of less than 3.5 seconds (10 V input step)(Supplemental Information)
• 10 MHz bandwidth (- 3dB) using E5252A cards (Supplemental Information)
• Channel isolation of 10 teraohms for low-current (triaxial) paths using E5252A cards

Architecture (using E5252A matrix cards)

• 6 low-current (triaxial) and 4 general-purpose (coaxial) inputs
• Modular design supports x12, x24, x36,and x48 triaxial output configurations
• Triaxial inputs 1 to 4 have dedicated internal paths
• Triaxial inputs 5 to 6 and the 4 coaxial inputs are multiplexed (3:1) and share 2 internal paths

Architecture (using E5255A multiplexer cards)

• 6 low-current (triaxial) inputs; 3 dc-bias (coaxial) inputs per card
• Modular design supports x24, x48, x72,and x96 triaxial output configurations
• Can gang up to four E5250A mainframes together to support up to 384 output channels

The Keysight E5250A low-leakage switch mainframe expands a single measurement station, such as the Keysight B1500A, 4155C, or 4156C, to an automated measurement system. Plug-in modules can be configured either as a cross-point matrix for general parametric measurements or as a multiplexer for long-term reliability measurements.

When configured as a 24 (8 x 3) Channel Multiplexer, the E5250A is ideal for long term reliability measurements with its 384 channel capability and advanced features typically found only on large, more costly input devices. This allows inexpensive power supplies to be used for consistent stressing.

The large number of channels and low-cost stress sources allow efficient testing of hundreds of devices in parallel, saving cost and time and achieving accurate, consistent results.