Component Reliability Analysis Test

Probe Station Specifications
● Temperature range : -45°C ~ 225°C
● Chuck size : 8″ wafer
● HV range : 200 V
● LC range: <100 fA
● Pulse module ✔
● CV module ✔
● Shielding Box ✔

Applicable Measurement Type
● FPD Testing
● On Wafer Device