今年9月禧恩取得Microtest代理權，Microtest Group 為封裝測試系統及晶片測試領域之開發商，在歐洲地區為領導者，提供半導體ATE設備製造和銷售、測試服務以及 IC設計服務，透過此次合作，未來禧恩將擴充更多的新產品，以滿足您在測試領域之需求(如：WLBI)，更多的產品介紹如下：
web www.microtest.net

In order to meet the different needs of customers, POMME will launch new products in 2024. It will provide more sophisticated technical services to assist you from product planning, research and development, to production and manufacturing, complete third-generation semiconductor test line solutions, major new products :
‧SiC/GaN CP Tester
‧WLBI（wafer level burn in）Tester
‧KGD Test Solutions

Welcome to call us to discuss your testing needs!
Customer Service Hotline: 03-5506360 Sales Department Ext. 215 / Ext. 218

Test SiC and GaN semiconductors at high switching speeds for optimal results

 

April 21st, Guildford, UK: ipTEST has been honoured with the prestigious King’s Award for Enterprise in recognition of advancing the test capabilities available for high power SiC and GaN semiconductors.

Wide bandgap SiC and GaN semiconductors have opened up new possibilities for power device performance. The benefits are widespread, from allowing electric vehicles to travel further on the same battery, to enabling more efficient, lower cost electricity conversion in power-hungry data centres.

Testing power devices before they reach the customer is crucially important to ensure they perform reliably throughout their lifetime. For the most accurate results, devices should be tested as close to their operating speed as possible. However, this is a challenge for SiC and GaN which are usually switched at much higher speeds than conventional silicon. A silicon tester just cannot keep up.

To solve this problem, ipTEST developed the DS5 test generator. The whole layout of DS5 was designed from the ground up to operate at the highest speeds and perform the fastest dynamic tests. The result is that DS5 gives the clearest picture of SiC and GaN device performance at speed, allowing manufacturers to maximize the quality of their products. This is particularly important for electric vehicle applications where power devices are at the heart of the drivetrain – nobody wants their electric car to fail on the freeway.

“DS5 has been tremendously well received by our customers and I’m so proud it’s been recognised in the Innovation category of the King’s Award.” says Dr Conor McCarthy, Managing Director at ipTEST. “This has been a true team effort by everyone within our company.”

Of course, this is not the end of the story as SiC and GaN semiconductors will continue to evolve and have much more performance to offer. As Demos Malaos, Technical Director at ipTEST says, “DS5 is the first step of the journey. We’ll continue to innovate to offer the highest performance testing capabilities for power devices.”

About the King’s Award
The King’s Awards for Enterprise was previously known as The Queen’s Awards for Enterprise, and the new name reflects His Majesty The King’s desire to continue the legacy of HM Queen Elizabeth II, by recognising outstanding UK businesses. The Award programme, now in its 57th year, is the most prestigious business award in the country, with successful businesses able to use the esteemed King’s Awards Emblem for the next five years.

About ipTEST
ipTEST helps semiconductor manufacturers test their most cutting-edge power devices to achieve optimal performance. Headquartered in Guildford, UK, ipTEST believes that doing the right thing, solving problems together and learning while we grow are key to delivering effective products.

For more information:

Nick Dajda, Sales and Marketing Director

+44 (0)7939 621015

nick.dajda@iptest.com

For more information on Product:

iptest.com/ds5

King’s award for innovation logo:

ipTEST DS5 Test Generator and Applications Adapter:

中山大學張鼎張教授(TSMC/UMC/AUO/Innolux等大廠客座講師, 照片中右三)與禧恩科技，雙方已經談定在GaN/SiC上的測試設備開發合作，張教授後續會安排親自到禧恩科技進行傳授教學，與客戶共同研討。

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